Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12308295 | Method for obtaining parameters of semiconductor structure, method for obtaining detection standard and detection method | Xinran Liu, Chunyang Wang | 2025-05-20 |
| 12245414 | Method of etching a memory stack by etching a blind hole | Runsheng Shen, Xifei Bao | 2025-03-04 |