Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12253538 | Method of examining a sample in a scanning tunneling microscope using tip-to-sample distance variations | Egor Ukraintsev | 2025-03-18 |
| 12253539 | Method of examining a sample in an atomic force microscope using attractive tip-to-sample interaction | Egor Ukraintsev | 2025-03-18 |