Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12387487 | Apparatus for adjusting parameter related to defect detection for image processing, method for information processing, and program | Kei Takayama, Yusuke Mitarai, Atsushi Nogami | 2025-08-12 |