Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12292386 | Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection method | Yukihiro Kagawa | 2025-05-06 |
| 12209971 | Foreign substance/defect inspection device, image generation device in foreign substance/defect inspection, and foreign substance/defect inspection method | Yukihiro Kagawa | 2025-01-28 |