Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12346764 | Item inspection system, inspection method, and information processing apparatus | Mitsuhide Murofushi, Tomoya Uehara, Yuki Nakajima, Kenichi Fujii | 2025-07-01 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12346764 | Item inspection system, inspection method, and information processing apparatus | Mitsuhide Murofushi, Tomoya Uehara, Yuki Nakajima, Kenichi Fujii | 2025-07-01 |