Issued Patents 2025
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12412263 | Automated defect detection | Jeremy Daniel VanDam, Sheldon McCrackin, Samvid Jhaveri | 2025-09-09 |
| 12211191 | Automatic inspection using artificial intelligence models | Xiaoqing Ge, Dustin Michael Sharber, Jeffrey Potts | 2025-01-28 |