Issued Patents 2025
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12429781 | Metrology method and associated metrology and lithographic apparatuses | — | 2025-09-30 |
| 12366809 | Methods and apparatus for controlling a lithographic process | Roy Werkman, David Deckers, Bijoy Rajasekharan, Ignacio Salvador Vazquez Rodarte | 2025-07-22 |
| 12306545 | Determining lithographic matching performance | Yingchao Cui, Hadi YAGUBIZADE, Xiuhong Wei, Daan Maurits Slotboom, Jeonghyun Park +3 more | 2025-05-20 |