Issued Patents 2025
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366445 | Measuring apparatus and method for roughness and/or defect measurement on a surface | Alexander Von Finck, Simon Halm, Maciej Neumann-Röbisch | 2025-07-22 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12366445 | Measuring apparatus and method for roughness and/or defect measurement on a surface | Alexander Von Finck, Simon Halm, Maciej Neumann-Röbisch | 2025-07-22 |