YW

Yi Nung Wu

Applied Materials: 1 patents #536 of 1,465Top 40%
Overall (2025): #162,918 of 469,880Top 35%
1
Patents 2025

Issued Patents 2025

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12211195 Edge defect detection via image analytics Yash Chhabra, Abyaya Dhar, Joseph Liu, Boon Sen Chan, Sidda Reddy Kurakula +1 more 2025-01-28