Issued Patents 2025
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12361526 | Reconstruction of a distorted image of an array of structural elements of a specimen | Yehuda Cohen | 2025-07-15 |
| 12347734 | Examination of a hole formed in a semiconductor specimen | Vadim Vereschagin, Grigory Klebanov, Roman Kris, Ilan BEN-HARUSH, Omer Kerem +2 more | 2025-07-01 |
| 12299868 | Control of a manufacturing process using contour curvature analysis of specimens | Einat Frishman, Ilan BEN-HARUSH | 2025-05-13 |
| 12277750 | Identification of an array in a semiconductor specimen | Yehuda Cohen | 2025-04-15 |
| 12272042 | Detection of defects using a computationally efficient segmentation approach | Elad Cohen, Victor EGOROV, Ilan BEN-HARUSH | 2025-04-08 |