Issued Patents 2025
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12398998 | Methods for high-resolution, stable measurement of pitch and orientation in optical gratings | Yangyang SUN, Jinxin FU | 2025-08-26 |
| 12384185 | Methods, systems, and apparatus for inkjet printing self-assembled monoloayer (SAM) structures on substrates | Yingdong Luo, Rami Hourani, Xiaopei Deng, Kang Luo, Erica Chen | 2025-08-12 |
| 12378662 | Ion implantation to modify glass locally for optical devices | Nai-Wen Pi, Jinxin FU, Kang Luo | 2025-08-05 |
| 12379280 | Method of measuring efficiency for optical devices | Jinxin FU, Yangyang SUN, Kazuya Daito | 2025-08-05 |
| 12372792 | High index edge blackening material | Yige Gao, Rami Hourani, Xiaopei Deng, Amita JOSHI, Kangkang Wang | 2025-07-29 |
| 12374552 | Methods for preparing small features on a substrate | Yongan Xu, Wei-Hao Wu | 2025-07-29 |
| 12353009 | Total or local thickness variation for optical devices | Yingdong Luo, Zhengping Yao, Daihua Zhang, David Alexander SELL, Jingyi Yang +4 more | 2025-07-08 |
| 12249489 | Optical device improvement | Yue Chen, Jinyu LU, Yongmei Chen, Jinxin FU, Zihao Yang +6 more | 2025-03-11 |
| 12236575 | In-line metrology systems, apparatus, and methods for optical devices | Yangyang SUN, Jinxin FU, Kazuya Daito | 2025-02-25 |
| 12229940 | In-line metrology systems, apparatus, and methods for optical devices | Yangyang SUN, Jinxin FU, Kazuya Daito | 2025-02-18 |
| 12225641 | Bake devices for handling and uniform baking of substrates | Hiram Cervera, Yongan Xu | 2025-02-11 |
| 12216243 | Air-spaced encapsulated dielectric nanopillars for flat optical devices | Tapashree Roy, Prerna Goradia, Srobona SEN, Robert Jan Visser, Nitin Deepak +1 more | 2025-02-04 |
| 12208637 | Patterning of optical device films via inkjet soluble mask, deposition, and lift-off | Yingdong Luo, Jinyu LU, Takashi Kuratomi, Alexia Adilene PORTILLO RIVERA, Xiaopei Deng +3 more | 2025-01-28 |
| 12203747 | Interference in-sensitive Littrow system for optical device structure measurement | Yangyang SUN, Jinxin FU | 2025-01-21 |