SZ

Siebe Tjerk De Zwart

AB Asml Netherlands B.V.: 1 patents #167 of 543Top 35%
Overall (2024): #266,241 of 561,600Top 50%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
11994806 Metrology method and apparatus, computer program and lithographic system Alexandru ONOSE, Remco Dirks, Roger Hubertus Elisabeth Clementine Bosch, Sander Silvester Adelgondus Marie JACOBS, Frank Jaco BUIJNSTERS +2 more 2024-05-28