JS

Jan Sijbers

IV Imec Vzw: 2 patents #7 of 154Top 5%
UA Universiteit Antwerpen: 2 patents #1 of 34Top 3%
Overall (2024): #156,549 of 561,600Top 30%
2
Patents 2024

Issued Patents 2024

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11953451 Item inspection by dynamic selection of projection angle Jan DE BEENHOUWER 2024-04-09
11927586 Item inspection by radiation imaging using an iterative projection-matching approach Jan DE BEENHOUWER 2024-03-12