Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11965730 | Method for measuring film thickness distribution of wafer with thin films | Susumu Kuwabara, Kevin Quinquinet | 2024-04-23 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11965730 | Method for measuring film thickness distribution of wafer with thin films | Susumu Kuwabara, Kevin Quinquinet | 2024-04-23 |