Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12147163 | Method for correcting critical dimension measurements of lithographic tool | Hsin-Yu Hsieh, Chang-Mao Wang, Chien-Hao Chen, Chun-Chi Yu | 2024-11-19 |
| 11929418 | Metal gate structure and method of fabricating the same | Jie-Ning Yang, Wen-Tsung Chang, Po-Wen Su, Bo SU, Chun-Mao Chiou +1 more | 2024-03-12 |
| 11881518 | Metal gate structure and method of fabricating the same | Jie-Ning Yang, Wen-Tsung Chang, Po-Wen Su, Bo SU, Chun-Mao Chiou +1 more | 2024-01-23 |