Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066483 | Method for testing an integrated circuit (IC) device at a testing temperature | Genesis Benjamin Carr, Vijian Techanamurthy | 2024-08-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066483 | Method for testing an integrated circuit (IC) device at a testing temperature | Genesis Benjamin Carr, Vijian Techanamurthy | 2024-08-20 |