Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933844 | Path based controls for ATE mode testing of multicell memory circuit | Wilson Pradeep | 2024-03-19 |
| 11921159 | Compressed scan chain diagnosis by internal chain observation, processes, circuits, devices and systems | Rubin Ajit Parekhji, Arvind Jain, Sundarrajan Subramanian | 2024-03-05 |
| 11879940 | Dynamic generation of ATPG mode signals for testing multipath memory circuit | Wilson Pradeep | 2024-01-23 |