Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12066484 | Method and device for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2024-08-20 |
| 12025655 | Method and system for wafer-level testing | Jun He, Yu-Ting Lin, Yung-Liang Kuo, Yinlung Lu | 2024-07-02 |