Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12159809 | System and method for measuring device inside through-silicon via surroundings | Yu-Hsien Li, Min-Tar Liu, Yuan-Yao Chang | 2024-12-03 |
| 11955392 | System and method for measuring device inside through-silicon via surroundings | Yu-Hsien Li, Min-Tar Liu, Yuan-Yao Chang | 2024-04-09 |
| 11927628 | Benchmark circuit on a semiconductor wafer and method for operating the same | CHU-FENG LIAO, HUNG-PING CHENG, Yuan-Yao Chang | 2024-03-12 |