Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11994555 | Probe card with angled probe and wafer testing method using the same | Yuan-Chun Wu, Chang Xu | 2024-05-28 |
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Ni SHEN
Overall (2024): #324,948 of 561,600Top 60%
1
Patents 2024