Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12140632 | Device under test synchronization with automated test equipment check cycle | Yongkang Hu, Ramalingam Kolisetti, Abhijeet Samudra | 2024-11-12 |
| 12015411 | Testable time-to-digital converter | Emil Gizdarski | 2024-06-18 |
| 11921160 | Using scan chains to read out data from integrated sensors during scan tests | Bartosz Gajda | 2024-03-05 |
| 11860751 | Deterministic data latency in serializer/deserializer-based design for test systems | Abhijeet Samudra, Ajay Nagarandal, Luis M. Cruz, Milin Kaushik Raijada, Ramalingam Kolisetti +3 more | 2024-01-02 |