Issued Patents 2024
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12123703 | Optical apparatus, optical inspection method and non-transitory storage medium | Hiroshi Ohno, Hiroya KANO, Hideaki Okano | 2024-10-22 |
| 12116513 | Adhesion/peeling method, and adhesion/peeling device | Tetsuya Kugimiya, Kazuo Watabe, Keisuke Ueno, Hidefumi Takamine, Junko Hirokawa +2 more | 2024-10-15 |
| 12104986 | Structure evaluation system, structure evaluation apparatus, and structure evaluation method | Hidefumi Takamine, Yuki Ueda, Keisuke Ueno, Yousuke Hisakuni, Kazuo Watabe | 2024-10-01 |
| 12098976 | Structure evaluation system and structure evaluation method | Yousuke Hisakuni, Hidefumi Takamine, Yuki Ueda, Keisuke Ueno, Kazuo Watabe | 2024-09-24 |
| 12101696 | Method, non-transitory computer readable storage medium, device and system that categorizes map information as static map information and dynamic map information and updates static map information differently from dynamic map information | Shinichiro Tsuda, Naoki Ide | 2024-09-24 |
| 12101449 | Image forming apparatus, image forming system, and image forming method for determining a file name for scanned image data | Masaya Fujitani | 2024-09-24 |
| 12092582 | Optical inspection device | Hiroshi Ohno | 2024-09-17 |
| 12038349 | Inspection system, inspection apparatus, and inspection method | Toshiki Takayasu, Kazuo Watabe, Atsuro Oonishi, Hiroshi Takahashi, Takamitsu Sunaoshi | 2024-07-16 |
| 12007363 | Measuring method and measuring device | Kazuo Watabe | 2024-06-11 |
| 11956395 | Image-forming apparatus, print management system, and method for controlling image-forming apparatus | Tomoki Minamikawa | 2024-04-09 |
| 11946906 | Damaged region determination system, determination apparatus and damaged region determination method | Toshiki Takayasu, Kazuo Watabe, Atsuro Oonishi, Hiroshi Takahashi, Takamitsu Sunaoshi | 2024-04-02 |
| 11888438 | Optical element, lighting apparatus and solar cell device | Hiroshi Ohno | 2024-01-30 |
| 11879815 | Non-contact non-destructive inspection system, signal processing device, and non-contact non-destructive inspection method | Hiroshi Ohno, Kazuo Watabe | 2024-01-23 |