Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933818 | Probe test card and method of manufacturing the same | Jae Hyoung Seo | 2024-03-19 |
| 11885846 | System and method of testing a semiconductor device | — | 2024-01-30 |
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11933818 | Probe test card and method of manufacturing the same | Jae Hyoung Seo | 2024-03-19 |
| 11885846 | System and method of testing a semiconductor device | — | 2024-01-30 |