LL

Liang Li

ST Sandisk Technologies: 9 patents #12 of 398Top 4%
WT Western Digital Technologies: 6 patents #31 of 549Top 6%
CC China Tiesiju Civil Engineering Group Co.: 1 patents #1 of 20Top 5%
Overall (2024): #3,758 of 561,600Top 1%
16
Patents 2024

Issued Patents 2024

Showing 1–16 of 16 patents

Patent #TitleCo-InventorsDate
12112814 Open block boundary group programming for non-volatile memory Ke Zhang, Ming Wang 2024-10-08
12099743 Non-volatile memory integrated with artificial intelligence system for preemptive block management Loc Tu, Yinfeng Yu, Xuan Tian 2024-09-24
12094550 Fast search for leaky word line Xingyan Zhou, Zhen Qin, William Mak, Yan Li 2024-09-17
12057172 Hybrid multi-block erase technique to improve erase speed in a memory device Ke Zhang 2024-08-06
12051473 Non-volatile memory with precise programming Ming Wang 2024-07-30
12046304 Programming techniques to improve programming time and reduce programming errors Ke Zhang 2024-07-23
12037908 Method for monitoring and analyzing large tunnel machines based on automatic collection of big data Xiaofang Pei, Heng Wang, Xiang Shen, Lina Xiao, Yuefeng Chu +10 more 2024-07-16
12040031 Non-volatile memory with autonomous cycling Yan Li, Wenkai Liu 2024-07-16
11978507 Non-volatile memory with intentional overprogramming to improve short term data retention issue Ming Wang, Ke Zhang 2024-05-07
11972804 Techniques for checking vulnerability to cross-temperature read errors in a memory device Xuan Tian, Henry Chin, Vincent Yin, Wei Zhao, Tony Zou 2024-04-30
11972817 State look ahead quick pass write algorithm to tighten ongoing natural threshold voltage of upcoming states for program time reduction Ke Zhang, Ming Wang 2024-04-30
11967383 Non-volatile memory with enhanced program operation for last state on slow plane Ke Zhang, Ming Wang 2024-04-23
11908524 Apparatus and methods for programming memory cells Ming Wang, Ke Zhang 2024-02-20
11908521 Non-volatile memory with redundant control line driver Qin Zhen 2024-02-20
11901015 Voltage kick for improved erase efficiency in a memory device Xuan Tian 2024-02-13
11894077 Self-diagnostic smart verify algorithm in user mode to prevent unreliable acquired smart verify program voltage Ke Zhang, Minna Li 2024-02-06