Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12136205 | Image-based defects identification and semi-supervised localization | Yan Kang, Janghwan Lee, Jinghua Yao, Sai MarapaReddy | 2024-11-05 |
| 11948347 | Fusion model training using distance metrics | Janghwan Lee, Yan Kang, Jinghua Yao, Sai MarapaReddy | 2024-04-02 |