Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11899959 | Method of testing memory device, memory built-in self test (MBIST) circuit, and memory device for reducing test time | Jaewon Park, Jaehoon Lee | 2024-02-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11899959 | Method of testing memory device, memory built-in self test (MBIST) circuit, and memory device for reducing test time | Jaewon Park, Jaehoon Lee | 2024-02-13 |