Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12105027 | Apparatus for inspecting substrate and method for fabricating semiconductor device using the same | Jang Ryul Park, Soon Kwon, Kwang Rak KIM, Sung Ho JANG | 2024-10-01 |