Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12159473 | Device for analyzing large-area sample based on image, device for analyzing sample based on image by using difference in medium characteristic, and method for measuring and analyzing sample using the same | Jong Muk LEE, Hee Chan Shin, Seong Won Kwon | 2024-12-03 |