Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906291 | Method of calculating thickness of graphene layer and method of measuring content of silicon carbide by using XPS | Eunkyu Lee, Yeonchoo Cho, Sangwon Kim, Kyung-Eun BYUN, Hyeonjin Shin | 2024-02-20 |