Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12092565 | Non-destructive inspection and manufacturing metrology systems and methods | Marco Alves, Robin Mair | 2024-09-17 |
| 11988641 | Characterization of patterned structures using acoustic metrology | Michael Kotelyanskii, Priya Mukundhan, Robin Mair | 2024-05-21 |