Issued Patents 2024
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12140630 | Method of finding optimized analog measurement hardware settings as well as method of measuring a device under test | Darren Tipton, Michael Simon, Martin Breinbauer | 2024-11-12 |
| 12028117 | Method as well as test system for testing a device under test | Wolfgang Dressel, Alexander Roth | 2024-07-02 |
| 11894882 | Measurement system and measurement method | Johannes Steffens, Torsten Schorr, Luke Cirillo | 2024-02-06 |
| 11874312 | Phase noise measurement method and measurement system | Andreas Lagler, Karolin Werthmueller | 2024-01-16 |