Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174334 | Distributed analysis X-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2024-12-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174334 | Distributed analysis X-ray inspection methods and systems | Shehul Sailesh Parikh, Jeffrey Bryan Abel, Siva Kumar, Joseph Bendahan | 2024-12-24 |