Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12087383 | Virtualized scan chain testing in a random access memory (RAM) array | David Paul Hoff, Rahul K. Nadkarni, Babji Vallabhaneni | 2024-09-10 |
| 11879936 | On-die clock period jitter and duty cycle analyzer | Ashish Akhilesh | 2024-01-23 |