Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12055560 | Automated optimization of AFM light source positioning | Jason Bemis, David Aue | 2024-08-06 |
| RE49997 | Metrological scanning probe microscope | Deron Walters, Jason Cleveland, Roger Proksch | 2024-06-04 |