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Mandeep Singh Bhatia

OI Ontario Die International: 1 patents #1 of 8Top 15%
📍 New Delhi, IN: #1 of 1 inventorsTop 100%
Overall (2024): #364,696 of 561,600Top 65%
1
Patents 2024

Issued Patents 2024

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
12152995 Die inspection method and apparatus Wesley Scott, Darryl Neil Poworoznyk, Petr Piro, Paul Sajecki, Eliel Paul Amora +2 more 2024-11-26