Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12132083 | Silicon carbide semiconductor device | Akimasa Kinoshita | 2024-10-29 |
| 12072180 | Measurement method for amount of deviation, and measurement apparatus | Beiping Jin | 2024-08-27 |
| 11936985 | Appearance inspection device and defect inspection method | Daisuke Konishi | 2024-03-19 |