Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044732 | Silicon test structures for separate measurement of NMOS and PMOS transistor delays | Prashant Singh | 2024-07-23 |
| 11923853 | Circuit structures to measure flip-flop timing characteristics | Prashant Singh | 2024-03-05 |