Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165023 | Measuring local CD uniformity using scatterometry and machine learning | Dexin Kong, Daniel Schmidt, Aron Cepler, Marjorie Cheng, Roy Koret | 2024-12-10 |
| 12152869 | Monitoring system and method for verifying measurements in patterned structures | Boaz Brill, Boris Sherman | 2024-11-26 |