Issued Patents 2024
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12038386 | Image capturing unit and inspection system | Masahiro Arai, Kaoru Kawakita | 2024-07-16 |
| 12021160 | Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrate | Koji Murakami, Akira Noda | 2024-06-25 |
| 11967659 | Semiconductor wafer, radiation detection element, radiation detector, and production method for compound semiconductor monocrystalline substrate | Koji Murakami, Akira Noda | 2024-04-23 |