Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175653 | Defect position determination system, appearance inspection method and program | Takuroh KASHIMA, Yusuke Koitabashi, Atsushi Matsuda | 2024-12-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12175653 | Defect position determination system, appearance inspection method and program | Takuroh KASHIMA, Yusuke Koitabashi, Atsushi Matsuda | 2024-12-24 |