AP

Adrian Perrig

NE Nec: 2 patents #285 of 1,085Top 30%
📍 Zürich, PA: #1 of 1 inventorsTop 100%
Overall (2024): #189,292 of 561,600Top 35%
2
Patents 2024

Issued Patents 2024

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
11868467 Semiconductor device, control flow inspection method, non-transitory computer readable medium, and electronic device Astha Jada, Toshiki Kobayashi, Takayuki Sasaki, Daniele Enrico Asoni 2024-01-09
11860762 Semiconductor device, control flow inspection method, non-transitory computer readable medium, and electronic device Astha Jada, Toshiki Kobayashi, Takayuki Sasaki, Daniele Enrico Asoni 2024-01-02