Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12148144 | Wafer inspection system | Chia-Lin Tsai, Hung-Ru Li | 2024-11-19 |
| 12019032 | Electronic system and method of specimen qualification | Hung-Chih Chang, Chug-Chi Chu, Chi-Min Tu | 2024-06-25 |