JL

Jonathan Lee

NI Nanotronics Imaging: 8 patents #6 of 27Top 25%
📍 Brooklyn, NY: #23 of 1,106 inventorsTop 3%
🗺 New York: #242 of 12,119 inventorsTop 2%
Overall (2024): #14,301 of 561,600Top 3%
8
Patents 2024

Issued Patents 2024

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDate
12153387 Threshold determination for predictive process control of factory processes, equipment and automated systems John B. Putman, Sarah Constantin, Valerie Bordelanne, Damas Limoge 2024-11-26
12140744 Autofocus system and method Patrick Schmidt, Denis Sharoukhov, Tonislav Ivanov 2024-11-12
12008737 Deep learning model for noise reduction in low SNR imaging conditions Denis Sharoukhov, Tonislav Ivanov 2024-06-11
11961210 System, method and apparatus for macroscopic inspection of reflective specimens Damas Limoge, Matthew C. Putman, John B. Putman, Michael Moskie 2024-04-16
11955686 Fault protected signal splitter apparatus John B. Putman, Matthew C. Putman, Damas Limoge, Michael Moskie 2024-04-09
11953863 Dynamic monitoring and securing of factory processes, equipment and automated systems Matthew C. Putman, John B. Putman, Damas Limoge 2024-04-09
11947671 Method, systems and apparatus for intelligently emulating factory control systems and simulating response data John B. Putman, Matthew C. Putman 2024-04-02
11894596 Fault protected signal splitter apparatus John B. Putman, Matthew C. Putman, Damas Limoge, Michael Moskie 2024-02-06