Issued Patents 2024
Showing 25 most recent of 32 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165740 | Memory traffic monitoring | Aaron P. Boehm, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum | 2024-12-10 |
| 12154639 | Memory fault notification | — | 2024-11-26 |
| 12141029 | Internal error correction for memory devices | Aaron P. Boehm | 2024-11-12 |
| 12141028 | Error status determination at a memory device | — | 2024-11-12 |
| 12079068 | Error log indication via error control information | — | 2024-09-03 |
| 12081235 | Syndrome check functionality to differentiate between error types | — | 2024-09-03 |
| 12066927 | Adaptive user defined health indication | Aaron P. Boehm, Todd Jackson Plum, Mark D. Ingram, Scott D. Van De Graaff | 2024-08-20 |
| 12066891 | Real time syndrome check | — | 2024-08-20 |
| 12051477 | Indicating a status of a memory built-in self-test for multiple memory device ranks | — | 2024-07-30 |
| 12046316 | Techniques for detecting a state of a bus | Aaron P. Boehm | 2024-07-23 |
| 12040037 | Interrupting a memory built-in self-test | — | 2024-07-16 |
| 12038806 | Evaluation of memory device health monitoring logic | Aaron P. Boehm, Scott D. Van De Graaff, Mark D. Ingram, Todd Jackson Plum | 2024-07-16 |
| 12014792 | Monitoring and adjusting access operations at a memory device | Mark D. Ingram, Todd Jackson Plum, Aaron P. Boehm, Scott D. Van De Graaff | 2024-06-18 |
| 12001305 | Resource allocation for a memory built-in self-test | — | 2024-06-04 |
| 11990200 | Bit retiring to mitigate bit errors | — | 2024-05-21 |
| 11984180 | Enabling or disabling on-die error-correcting code for a memory built-in self-test | — | 2024-05-14 |
| 11983433 | Techniques for detecting a state of a bus | — | 2024-05-14 |
| 11977772 | Temperature monitoring for memory devices | Aaron P. Boehm, Todd Jackson Plum, Scott D. Van De Graaff, Mark D. Ingram | 2024-05-07 |
| 11966602 | Refresh counters in a memory system | Aaron P. Boehm | 2024-04-23 |
| 11960360 | Redundancy-based error detection in a memory device | Aaron P. Boehm | 2024-04-16 |
| 11953988 | Error correction memory device with fast data access | Aaron P. Boehm | 2024-04-09 |
| 11947806 | Life expectancy monitoring for memory devices | Aaron P. Boehm, Scott D. Van De Graaff, Todd Jackson Plum, Mark D. Ingram | 2024-04-02 |
| 11942966 | Managing error control information using a register | Aaron P. Boehm | 2024-03-26 |
| 11928018 | Coordinated error protection | Aaron P. Boehm | 2024-03-12 |
| 11929134 | Indicating a status of a memory built-in self-test | — | 2024-03-12 |