Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12050187 | Dual source X-ray inspection system and method | Yeroslav Berezin, Ofek Oiknine | 2024-07-30 |
| 11969276 | Dual head X-ray inspection system | Kiyoshi Ogata, Doron Reinis, Ofek Oiknine | 2024-04-30 |