Issued Patents 2024
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12073549 | Stress analysis device | Yousuke Irie, Michiyasu HIROTA | 2024-08-27 |
| 11965735 | Thickness measurement method, thickness measurement device, defect detection method, and defect detection device | Yousuke Irie, Koutaro SAKAMOTO | 2024-04-23 |