Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906281 | Device and method for measuring thickness and refractive index of multilayer thin film by using angle-resolved spectral reflectometry | Hyug-gyo Rhee | 2024-02-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11906281 | Device and method for measuring thickness and refractive index of multilayer thin film by using angle-resolved spectral reflectometry | Hyug-gyo Rhee | 2024-02-20 |