Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12044654 | Measurement method for non-destructive inspection, measurement device, non-destructive inspection method, information processing device of non-destructive inspection, and recording medium | Hiroshi Morita, Katsunori Teshima, Mitsuru Mimori, Yoshiyuki Hashimoto | 2024-07-23 |