Issued Patents 2024
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11955391 | Process monitoring of deep structures with X-ray scatterometry | Antonio Arion Gellineau | 2024-04-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11955391 | Process monitoring of deep structures with X-ray scatterometry | Antonio Arion Gellineau | 2024-04-09 |