Issued Patents 2024
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11978679 | Substrate with cut semiconductor pieces having measurement test structures for semiconductor metrology | — | 2024-05-07 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11978679 | Substrate with cut semiconductor pieces having measurement test structures for semiconductor metrology | — | 2024-05-07 |